tests: drivers: lpuart: Fix two chip test - #28430
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Test which run on nrf9160 and nrf52480 was failing as uart driver is now releasing UART pins when in idle. It means that TX pin should have pull-up as otherwise it is floating and can lead to errors in the communication. Test was failing due to that. Added pull-ups to TX pins in pinctrl sleep state. Enforced pinctrl sleep state to be present (event when PM device is not used). Added detection of premature test completion which could lead to false positive. Test is now failing if too few packets are received. Signed-off-by: Krzysztof Chruściński <krzysztof.chruscinski@nordicsemi.no>
nordic-segl
approved these changes
Apr 28, 2026
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CI InformationTo view the history of this post, click the 'edited' button above Inputs:Sources:sdk-nrf: PR head: 23e0a61e2574431a0c4126af4cff09f45fc46289 more detailssdk-nrf:
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List of changed files detected by CI (4)Outputs:ToolchainVersion: 53ac68dd62 Test Spec & Results: ✅ Success; ❌ Failure; 🟠 Queued; 🟡 Progress; ◻️ Skipped;
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nordic-piks
approved these changes
Apr 28, 2026
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Test which run on nrf9160 and nrf52480 was failing as uart driver is now releasing UART pins when in idle. It means that TX pin should have pull-up as otherwise it is floating and can lead to errors in the communication. Test was failing due to that.
Added pull-ups to TX pins in pinctrl sleep state.
Enforced pinctrl sleep state to be present (event when PM device is not used).
Added detection of premature test completion which could lead to false positive. Test is now failing if too few packets are received.